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#Yanbin Qiao
Study of Heat Transport Behavior in GaN-Based Transistors by Schottky Characteristics Method
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Degradation Analysis of Facet Coating in GaAs-Based High-Power Laser Diodes
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
The research on temperature distribution of GaN-based blue laser diode
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Thermal investigation of LED array with multiple packages based on the superposition method
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Working Thermal Stresses in AlGaAs/GaAs High-Power Laser Diode Bars Using Infrared Thermography
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Cycled Thermomechanical Failure in 808-nm High-Power AlGaAs/GaAs Laser Diode Bars
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Transient thermal characteristics related to catastrophic optical damage in high power AlGaAs/GaAs laser diodes
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
The impact of the stress induced by lateral spatial hole burning on the degradation of broad-area AlGaAs/GaAs laser diodes
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Thermal resistance analysis related to the degradation of GaAs-Based laser diodes
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Thermal Analysis of GaAs-Based High Power Laser Diodes Related to Degradation
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Reliability of solder joints in High-power LED package in power cycling tests
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
The thermal properties of AlGaAs/GaAs laser diode bars analyzed by the transient thermal technique
Novel Semiconductor Devices and Reliability Lab , 北京工业大学