首页
(current)
大学
论文
新闻
招聘
FAQ
简体中文
中
En
登录
注册
#Xueqin Gong
Degradation Analysis of Facet Coating in GaAs-Based High-Power Laser Diodes
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Self-heating and traps effects on the drain transient response of AlGaN/GaN HEMTs
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Determining Drain Current Characteristics and Channel Temperature Rise in GaN HEMTs
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
The channel temperature dependence of drain transient response in AlGaN/GaN HEMTs
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Thermal analysis in high power GaAs-based laser diodes
Novel Semiconductor Devices and Reliability Lab , 北京工业大学
Transient and long-term catastrophic optical damage in high power AlGaAs/GaAs laser diodes
Novel Semiconductor Devices and Reliability Lab , 北京工业大学