array(2) { ["lab"]=> string(4) "1176" ["publication"]=> string(4) "9758" } Influence of edge effects on single event upset susceptibility of SOI SRAMs - 单粒子效应研究组 | LabXing

Influence of edge effects on single event upset susceptibility of SOI SRAMs

2015
期刊 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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